International seminar on the reliability of micro nano electronic devices in 2017.
"2017 international symposium on" extreme environment micro-nano electronic components reliability on May 22-24 held in chengdu in sichuan province, more than 200 experts and scholars at home and abroad gathered together under extreme conditions the latest research results in the field of micro electronic device reliability. As an invited guest, Semishare is honored to participate in this seminar, which is a recognition of the company in the industry, and also a strong confidence for us to further strengthen our company.
Congress set up five at the venue, respectively around electronics reliability (new devices, defect, the physical mechanism and the modeling and simulation, etc.), the reliability design (material level, technology level, device level, circuit level, system level), the damage effect of extreme environment and optimization technology, the charging and discharging effect and electrostatic protection, such as failure characterization and analysis topics for discussion. From the United States, France, the United Kingdom, Germany, Italy, China and other countries, 33 experts in the field of reliability of the field of industry and industry experts make oral invitation report, 58 scholars give oral reports. The conference featured 68 posters and received a lot of attention from participants.